Submissions must be original, expert-level contributions from metrology practitioners working in the portable and stationary metrology field or performing research in all areas of 3D metrology. Technical papers can cover all aspects of metrology competencies gained from research and development, best practices, technology benchmarks, and innovative use cases exploring the adoption or adaptation of metrology solutions for problem solving or process control. Commercial content is not accepted by the CMS.
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As a bonus, conference registration and membership fees are waived for individual speakers presenting at the conference. In the case of multiple authors, the CMS will waive one conference registration and membership fee.
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Metrology
Call for Papers for the Coordinate Metrology Society Conference
Presentation and publication opportunities for both portable and stationary measurement leaders
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The CMS dedicates itself to serving the education and career needs of expert and novice metrologists. An impressive array of authoritative white papers and presentations were delivered at its 2023 conference, covering topics such as advancements in photogrammetry, concepts on improved filtering of 3D data, and automated data collection and analysis. Speakers hailed from: Airbus, ATT Metrology Solutions, Boeing, Bruker Alicona, Duke Energy, IDEKO Research Centre, LM Wind Power, Lockheed Martin, National Physical Laboratory, Newport News Shipbuilding, Parker Intellectual Property Enterprises LLC, Pennsylvania State University, UNCC Center for Precision Metrology, Werth, and many other organizations.