Call for Papers for the Coordinate Metrology Society Conference

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For more information, contact Chris Greer, Chris Barrow, Katelyn Neese, or Benjamin Thomason, technical presentations coordinators, at [email protected]

(CMS: Weatherford, TX) — The Coordinate Metrology Society (CMS) announced its 2024 Call for Papers for the 40th annual Coordinate Metrology Society Conference (CMSC), July 22–25, 2024, in Charlotte, North Carolina.

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The eminent membership association for measurement professionals worldwide, the CMS encourages abstract submissions that explore diverse applications of 3D metrology (stationary and portable) to improve processes, productivity, and the user experience. Since 1984, industry leaders have contributed more than 500 high-level technical papers and presentations to the CMSC portfolio, the most comprehensive repository of portable metrology knowledge and information. For more information, visit

Published: Monday, February 19, 2024 – 12:00

Submissions must be original, expert-level contributions from metrology practitioners working in the portable and stationary metrology field or performing research in all areas of 3D metrology. Technical papers can cover all aspects of metrology competencies gained from research and development, best practices, technology benchmarks, and innovative use cases exploring the adoption or adaptation of metrology solutions for problem solving or process control. Commercial content is not accepted by the CMS.

As a bonus, conference registration and membership fees are waived for individual speakers presenting at the conference. In the case of multiple authors, the CMS will waive one conference registration and membership fee.   

After the conference, the CMS Presentation Committee will select the top technical papers presented at CMSC 2024 for publication in the Journal of the CMSC. This technical journal provides additional coverage of the published work to an even larger global audience. CMS members in good standing can also access the technical papers and presentations via the CMSC website. Authors and researchers are also encouraged to cite CMSC technical papers if referenced in their own technical papers.


Call for Papers for the Coordinate Metrology Society Conference

Presentation and publication opportunities for both portable and stationary measurement leaders

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The deadline for abstract submissions for technical papers and presentations is March 15, 2024. The CMS Presentation Committee peer reviews each abstract and, if selected, the speaker will receive a notification of acceptance on April 5, 2024. Presentations that are accompanied by a technical paper will receive preference for acceptance. The CMSC website has the full schedule of submission dates. The 2024 CMSC Technical Paper Guidelines document can be downloaded here.

The Coordinate Metrology Society encourages papers and presentations that cover research and development driving the future of metrology, such as the smart factory, 3D printing, artificial intelligence (AI), precision assembly, automation and manufacturing cells, and other trends that unlock the potential of 3D metrology technologies. Further, the CMS would like to solicit papers and presentations that cover practical applications in 3D metrology that showcase novel approaches to data collection/analysis and advance the concepts of 3D metrology.

The CMS dedicates itself to serving the education and career needs of expert and novice metrologists. An impressive array of authoritative white papers and presentations were delivered at its 2023 conference, covering topics such as advancements in photogrammetry, concepts on improved filtering of 3D data, and automated data collection and analysis. Speakers hailed from: Airbus, ATT Metrology Solutions, Boeing, Bruker Alicona, Duke Energy, IDEKO Research Centre, LM Wind Power, Lockheed Martin, National Physical Laboratory, Newport News Shipbuilding, Parker Intellectual Property Enterprises LLC, Pennsylvania State University, UNCC Center for Precision Metrology, Werth, and many other organizations.